Reflectometers and thickness measurement
Thin-film reflectometry measurement systems make it possible to measure reflectance, thickness and optical indices of single- and multi-layer deposition quickly and with high precision. With Filmetrics / KLA equipment, Scientec offers a wide range of single / multiple measurement solutions, online, adapted on microscope or in situ.
10Å à 10mm? Aucun problème
With one click, you can measure and deduce the reflectance spectrum the thickness of a thin film by analyzing how the film reflects light. By measuring light not visible to the human eye, films as thin as 1 nm and as thick as 13 mm can be measured ....
With one click, you can measure and deduce the reflectance spectrum the thickness of a thin film by analyzing how the film reflects light. By measuring light not visible to the human eye, films as thin as 1 nm and as thick as 13 mm can be measured ....
Customizable thickness mapping - best cost/effective solution F50 >
Fine spot size - sample up to 450mm in diameter - R&D. F54 >
Acoustic protection cover - Production. F54-XY-200 >
High automation - notch detection - SECS / GEM interface. F60 >
