Cutting-Edge Atomic Force Microscope for Advanced Research Nano-Observer II 1. Exceptional performance for cutting-edge research 2. Ultra-high resolution and unmatched measurement precision 3. Complete suite of advanced electrical modes and extensive environmental compatibility 4. Intuitive user interface with advanced automation The Nano-Observer II is a premium AFM microscope offering unprecedented measurement capabilities. Its innovative […]
Optical profilometer D-surface-View D-surface-View 1. Local and global inspection from mm to nm 2. Measurement in a single acquisition 3. Nanoscale D-Surface View is intended to help manufacturers of wafers up to 300mm in diameter reduce costs and for chipmakers to improve yields of devices manufactured with best-in-class process technology. The equipment can be used […]
Galaxy Dual Controller https://www.youtube.com/watch?v=D0_f8Ded11s AFM Microscopy Nano-Observer : The best cost/effective AFM >> ResiScope II : Current / Resistance over 10 decades >> Need Help ? Contact us >> New opportunities with 5100/ 5500/ Multimode, AFM/STM bases The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available […]
Your Free Surface Analysis Technical Expertise WOULD YOU LIKE TO OBTAIN THE OPINION OF AN EXPERT ON YOUR APPLICATION AND ASSOCIATED TECHNIQUES? BENEFIT FROM FREE TECHNICAL EXPERTISE! Do you want to go further in your research and discover new analysis techniques? Let’s go! During a 30-minute telephone conversation, we discuss your goals and the research […]
Automated Thickess Mapping for Production Environments F60 1. Dedicated to production 2. Automated 3. Fast 4. Customizable The F60-t family maps film thickness and index just like our F50 products, but it also includes a number of features intended specifically for production environments. These include automatic notch finding, automatic on-board baselining, an enclosed measurement stage with […]
Automated Film Thickness Mapping – up to 200mm F54- XY-200 1. Sample up to 200mm in diameter 2. Automated XY stage 3. Thin, thick, rough and opaque films Thin-film thickness on samples up to 200mm by 200mm is easily mapped with the F54-XY-200 advanced spectral reflectance system. The motorized X-Y stage moves automatically to specified […]
Automated Film Thickness Mapping F54 1. Sample up to 450 mm in diameter 2. No limit on the number of points 3. Easy to use 4. Wide wavelength range Thin-film thickness of samples up to 450 mm in diameter are mapped quickly and easily with the F54 advanced spectral reflectance system. The motorized r-theta stage moves automatically […]
Spot measurement – High thickness F70 1. Built-in online diagnostics 2. Standalone software included 3. Sophisticated history function for saving, reproducing, and plotting results The F70s are general-purpose thickness measurement instruments that are capable of measuring thicknesses up to 15mm. Common applications include glass and plastic sheets, lenses, and containers and semiconductor wafers. The basic […]
Resistivity & conductivity mapping R50 Serie 1. Four-point probe and eddy-current probe systems 2. Sample mapping in rectangular, linear, polar and custom configurations 3. X-Y travel up to 200mm 4. Measure a ten-decade range of sheet resistance on conductive and semi-conductive films 5. Contact and non-contact measurement Filmetrics® sheet resistance measurement tools marry the technology developed […]
Remote plasma cleaner Semi-Kleen & EM- Kleen Series Plasma cleaning solution for contamination control in high vacuum systems, such as SEM, FIB, AES, XPS, ALD, EUVL, etc. SEMI-KLEEN and EM-KLEEN series remote plasma cleaners were based on the high efficiency inductively coupled plasma (ICP) discharge technology developed at the Lawrence Berkeley National Laboratory. Our patent […]
Plasma Cleaners Tergeo series Tergeo series tabletop plasma cleaners 1. Intelligent and intuitive design 2. Quantitative plasma measurement technology3. Immersion and downstream plasma processing modes in one system4. Recipe and job sequence5. Pulsed operation Why choose Tergeo plasma cleaner Better plasma uniformity with external electrode design Unique plasma sensor technology for quantitative plasma strength measurement […]
Precision nanoindenter G200X 1. Easy to use and user-friendly 2. Mechanical test at the nanometric scale 3. Precise quantitative results 4. Large variety of sample The Nano Indenter G200X provides an easy-to-use nanoscale mechanical tester that quickly delivers accurate, quantitative results. The G200X system handles a wide variety of samples from hard coatings to soft […]