Photometry -Colorimetry

Scanning Probe Microscopy
 

CSInstruments

- Nano-Observer AFM

- ResiScope current and resistance measurements

Anasys Instruments

- NanoIR2 (AFM+IR)

- NanoIR2-s (AFM-IR+SNOM)

Nanonics

-Microscopy SNOM

Accessoires

- AFM Probes

2D/3D optical profilometry

KLA Tencor

- Interferometer

Toho Technology

- Stress measurement

Sensofar

- Interferometer

- Interferometer/ confocal

- Inspection stents

Lyncee Tec

- 3D dynamic holography

- MemsTool

- Reflectometer

Filmetrics

- Optical profilometer

Accessories

- Calibration standards

Measurement of light sources and monitors

Konica Minolta

- Luxmeter

- Luxmeters/ Chromameters

- Photometers/ chromameters

- Spectro-radiometers

- Videocolorimeters

- Screen Analyzers

Gooch & Housego

- Photometers radiometers

- Light source

- Spectroradiometers

TechnoTeam

- 2D Photometer

- Video-photometers


- Video-colorimeters

Jeti

- Spectroradiometers

- Spectroradiometers UV

Nano-Indentation

Nanomechanics

- In-Situ Indenter

- Nano-Indenter iNano

- Nano-Indenter iMicro

- Nano-Indenter (Ambient & Vacuum)

Mechanical Profilometry

KLA Tencor

- Profilometer

Toho Technology

- Profilometer large sample

Accessories

- Calibration standards

Thin film

Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant

Vacuum Technology

Prevac

- Ultra High Vacuum systems

- Manipulators, goniometer...

- Chamber

- Sample holders

- Instruments

- Accessories

- Electronics

- Software

Photovoltaic measurement

Konica Minolta

- Reference PV cells