Surface analysis

Photometry -Colorimetry

Scanning Electron Microscopy
 

Coxem

- EM-30AX Plus (SEM)

- EM-30AX (SEM)

- EM-30 Plus (SEM)

- EM-30 (SEM)

- CX-200TM (SEM)

- CX-200TA (SEM)

- CX-200 Plus (SEM)

- Ion Coater (SEM sample)

- EDS Options

- Cross Pollsher

Scanning Probe Microscopy
 

CSInstruments

- Nano-Observer AFM

- ResiScope current and resistance measurements

Nanonics

-Microscopy SNOM

Accessoires

- AFM Probes

2D/3D optical profilometry

KLA Tencor

- Interferometer

Toho Technology

- Stress measurement

Sensofar

- Interferometer

- Interferometer/ confocal
- Inspection stents

Lyncee Tec

- 3D dynamic holography

- Wafer inspection

- MemsTool

- Reflectometer

Filmetrics

- Optical profilometer

Accessories

- Calibration standards

Measurement of light sources and monitors

Konica Minolta

- Luxmeter

- Luxmeters/ Chromameters

- Photometers/ chromameters

- Spectro-radiometers

- Videocolorimeters

- Screen Analyzers

Optronic Laboratories

- Photometers radiometers

- Light source

- Spectroradiometers

TechnoTeam

- 2D Photometer

- Video-photometers
- Video-colorimeters

Jeti

- Spectroradiometers

- Spectroradiometers UV

Vacuum Technology

Prevac

- Ultra High Vacuum systems

- Manipulators, goniometer...

- Chamber
- Sample holders

- Instruments

- Accessories
- Electronics

- Software

Spectroscopy (IR & Raman)

Photothermal spectroscopy corp (Infra-Red)

- mIRage (sub-µm IR spectroscopy)

S&I ( Raman)

- Monovista

- Triple-Spectrometer

Thin film

Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant

- InLine/ In-Situ

Nano-Indentation

KLA Tencor

- In-Situ Indenter

- High Temperature
- Nano-Indenter iNano
- Nano-Indenter iMicro
- Nano-Indenter (Ambient & Vacuum)

- Nano-Indenter G200
- T150 UTM
- NanoSuite

Mechanical Profilometry

KLA Tencor

- Profilometer

- Simulator stylus / channels

Toho Technology

- Profilometer large sample

Accessories

- Calibration standards